• Test Service
Total test solutions include test program development, test tool design, and production support. These services cover chip probe, test program development, and socket,probe card and load board design. With company’s endeavors to develop IP Portfolio on high speed interface and RF product, our test service capability has also been expanded to the high speed interface products like PCIe, XAUI, Serdes, SATA, DDRn, LVDS, and TMDS as well as RF products such as PA, LNA, mixer/VCO, transmitter/receiver, and transceiver.

Two in-house ATEs ( Verigy 93K Pin Scale & Teradyne J750) are available. The in-house ATEs have reduced test bring up time significantly.

  • High Speed / RF Test Milestones

  • Test Solution and HW Design Examples



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